Bonding
Bonding techniques
Wafer to-wafer Bonding
Chip-to-wafer bonding
Wafer Bonding can be done with or without intermediate layers to bond the wafer temporarily or permanently.
Available bonding techniques are described below:
1.With the intermediate layer
a. Metal layer
Hybrid bonding
Combination of fusion bonding and metal diffusion bonding into a single process
Extension of fusion bonding with wafer surface having dielectric and embedded metal interconnects layer
Wafer pre-processing/ cleaning with CMP
Prebonding at room temperature under plasma and atmospheric pressure allows the bonding of the dielectric layers.
Annealing at 100-300C allows electrical contact via metal diffusion bonding.
Alignment accuracy ±1 μm
Application 3D stacking
Metal Diffusion bonding
Also known as Thermo-compression bonding
Uses two metals Al-Al, Cu-Cu, and Au-Au, for bonding wafers together with heat and compression
Metals diffusion allows both mechanical and electrical bonding in one step.
Eutectic bonding/ Solder bonding/ Eutectic Soldering
Uses an intermediate metal layer (eutectic alloys) that melts at low temperature than individual metals
Eutectic alloy deposition, adhesion layers(Ti or Cr), diffusion barrier layers (Ni or Pt) by sputtering
Pretreatment: removing oxide by wet/dry etching/ ashing
AuSn low-temperature bonding at a temperature lower than 300C
AlGe
AuGe
AuSi (producing hermetic seal at low temperature (390C))
b. Insulator layer
Glass frit bonding
Glass soldering/ seal glass bonding
Bonding technique with specially developed intermediate glass layer (glass frit) to match CTE (coefficient of thermal expansion)
Steps
Frit layer deposition by spin coating/ screen printing
Heating glass frit to form compact glass layers
Thermo compression process (400C)
Glass-metals, glass ceramic metal bonding
Application MEMS packaging
2. Adhesive bonding
Low-temperature, low-cost bonding
Permanent or temporary bonding
thermally curable or UV-curable polymer adhesives
Polyimide
Epoxy
BCB
2. Without the intermediate layer
a. Direct bonding
Fusion bonding
Bonding at room temperature followed by annealing
Wafer pre-processing/ cleaning with CMP
Plasma activated bonding
Low-temperature fusion bonding (100-300C)
2. Room temperature bonding/ surface-activated bonding (SAB)
Surface activation by FAB (Fast atomic beam) (remove oxide layers)
High or ultra-high vacuum requirements
Max. applied load 100kN
Examples: LiNbO3 wafer to Si bonding
b. Anodic bonding
Electrostatic field
Low temp. Bonding
Vacuum or atmospheric pressure bonding
Ion migration due to electrical field (use of a sodium-containing glass)
Need of the same coefficient of expansion as that of glass
Glass layer deposition by sputtering is possible
Bonding glass with silicon or metal, glass silicon glass bonding (triple stack bonding)
Generation of hermetic bonds
Applications: Microfluidics, MEMS
Alignment by IR transparent image
Size: from small chips to 12-inch wafers
Bonding Inspection by Scanning Acoustic microscope images (C-SAM)
AFM to check the surface roughness
PDMS Chip Bonding
PDMS to PDMS bonding
PDMS to Glass
PDMS to SUS